VIC-3D Stereoscopic Microscopy System

The VIC-3D stereomicroscopy system of Correlated Solutions is a high-precision optical system used for measuring the surface shape, deformation, and strain of micro-scale specimens under applied loads. By using a stereomicroscope equipped with a high-resolution machine vision digital camera, a custom beam splitter, a precise 3-axis electric (or manual) stage, and software for complex distortion correction, high magnification measurements can be achieved, making it highly suitable for measuring the strain of composite fibers, solder joints, electrical components, biological materials, etc.
Challenges faced 
Traditionally, it has been difficult to obtain three-dimensional DIC measurements on samples requiring high magnification. This is mainly due to the lack of optical elements with sufficient depth of field to acquire two high-magnification images from different perspectives. Stereo microscopes overcome the limitation of depth of field, but using a single-objective lens with a complex optical system brings distortions that are not considered in traditional calibration methods. These uncorrected images will lead to significant bias in the analyzed shape and strain measurement data. In fact, it is not uncommon to observe deviations of several thousand micro-strains or more without correction. 
Solution: VIC-3D stereomicroscopy system, featuring 3D distortion correction function 

To address this issue, Correlated Solutions has developed an easy-to-use calibration method that can correct the complex, non-radial optical distortions present in stereomicroscopes and can completely eliminate shape and strain deviations in measurements.

System Features 
• Zoom range (field of view): 0.8mm to 8mm 
• 3D coordinates, displacement, velocity and全场 strain measurement
• Automatic calibration using an electric stage
• Easy zooming between 1x and 8x magnification
• Independent optical path adjustment for optimal image overlap
• Powerful tool for iris visualization data. Outline display can be superimposed on the sample image
• Data can be exported in Tecplot/ASCII pure， Matlab and STL formats
• Node data can be easily extracted for finite element analysis verification